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February 27, 2006 Vol. 77, no.
7S
Events
and Announcements
More on metrology
On Friday, March 3, the EECS department with host “Semiconductor Metrology
at 45 nm and Beyond,” a lecture by Jason Cain of Advanced Micro Devices.
Cain will focus on lithography metrology and discuss some of the challenges
ahead. The event will take place at 1 p.m in the Hogan Room (521 Cory Hall).
For more information, go to http://microlab.berkeley.edu/text/298-12.seminar.
What are you up to?
Engineering News covers all things student engineer: research projects, extracurricular
activities, courses and student group activities. We also publish student
and faculty honors and awards, announcements, upcoming events and alumni
stories. Email rshafer@berkeley.edu.
E 190 placement test info
All students planning on taking E 190 are required to take the Engineering
190 Placement Test before enrolling in the course. The next test is scheduled
for Thursday, March 23, from 5:30 to 7:30 p.m. in Sibley Auditorium (Bechtel
Engineering Center). Students planning on taking E 190 in the summer or fall
of this year must take the test on March 23 if you have not already taken
it. You do not need to sign up; just arrive promptly at 5:30 p.m. with a
pencil or pen and your student ID.
Get the complete, up-to-date Engineering Calendar at www.coe.berkeley.edu/events.
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